Gold-plated thickness measurement by SEM
1 Scope
This standard specifies the technical requirements of the gold-plated thickness measurement by SEM for various gold products. This standard is also applicable to the gold-plated thickness measurement by the electro-probe microanalyzer, and the applicable thickness measurement range is 0.2 to 10 μm.
It may serve as a reference for the measurement of the plated thickness of other metal materials.
2 Normative references
The following normative documents contain provisions which, through reference in this text, constitute provisions of this standard. At the time of publication, all editions cited are valid. All standards are subject to revision, and all parties using this standard are encouraged to investigate the possibility of applying the latest editions of the following standards.
GB/T 12334-1990 Metallic and other inorganic coatings - Definitions and conventions concerning the measurement of thickness
GB/T 13298-1991 Metal - Inspection method of microstrcture
GB/T 15616-1991 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 16594-1996 Micron grade length measurement by SEM
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
3 Terms
local thickness
the thickness value of a certain part measured on the reference surface
average thickness
The arithmetic average of a specified number of measured values of local thickness selected at different parts of the reference surface
Note: See GB/T 12334-1990 for the definition of reference surface.
Foreword i
1 Scope
2 Normative references
3 Terms
4 Principle
5 Standard device, instruments and equipment
6 Experimental methods
7 Measuring error
8 Testing Report
Annex A (Informative) Formula of Ni plating
