標準編號:	NB/T 47013.11-2015/XG1-2018
中文名稱:	承壓設備無損檢測 第11部分：X射線數字成像檢測||含行業標準第1號修改單
英文名稱:	Nondestructive Testing of Pressure Equipments Part 11: Standard practice for X-ray digital radiography, includes Amendment 1
中標分類:	H26    金屬無損檢驗方法
行業分類:	NB    能源行業標準
ICS分類:	77.040.20 77.040.20    金屬材料無損檢測 77.040.20
發布機構:	國家能源局
發布日期:	2015-04-02
實施日期:	2018-7-1
標準狀態:	valid
替代舊標準:	NB/T 47013.11-2015 承壓設備無損檢測 第11部分：X射線數字成像檢測
翻譯語言:	英文
文件格式:	PDF
中文字符數:	24000 字
翻譯價格(元):	1450.0
交付時間:	付款后 1 個工作日

Notice of Amendment to the Professional Standard NB/T 47013.11-2015 Nondestructive Testing of Pressure Equipments Part 11: Standard Practice for X-ray Digital Radiography Amendment 1 This amendment was approved by No.7 Announcement by the National Energy Administration on May 14, 2018 and shall be implemented as of July 1, 2018. ○1 New provisions are added following "GB/T 23903 Resolution Indicators for Ray Image" in Clause 2: GB/T 26592 Non-destructive Testing Instruments - Properties Test Methods of Industrial X-ray Apparatus GB/T 26594 Non-destructive Testing Instruments - Properties Test Methods of Industrial X-ray Tube New provision is added following "NB/T 47013.2 Nondestructive Testing of Pressure Equipments - Part 2: Radiographic Testing": JB/T 11608 Non-destructive Testing Instruments Industrial X-ray Apparatus for Radiographic Testing ○2 In 4.1.1, the expression: "obtain radiation staff card" is changed to "obtain the corresponding certificate in accordance with the requirements of relevant laws and regulations". ○3 In 4.2, the expression: "Testing system" is changed to "Testing system and apparatus" ○4 New provision 4.2.1.3 is added following 4.2.1.2: The performance indexes of X-ray machine adopted shall meet the requirements of JB/T 11608. See GB/T 26594 and GB/T 26592 for the testing conditions and testing methods for the service performance. ○5 4.2.2.4 is replaced by the following new provision: Bad pixel requirements: In the 3×3 pixel area of the area array detector, the number of adjacent bad pixels shall not exceed 3; the number of the bad pixels in a line (column) shall not exceed 3, and those bad pixels shall not be located within 200 pixels from the center; the number of bad pixels in the imaging area shall not exceed 1% of the total pixels. In a linear array detector, the number of adjacent bad pixels shall not exceed 2. The detector system supplier shall provide the bad pixel list and bad pixel correction method upon delivery. ○6 New provisions 4.2.2.6 and 4.2.2.7 are added following 4.2.2.5: "4.2.2.6 The testing conditions and testing methods for performance indexes of the detector system, such as bad pixels, contrast sensitivity, resolution ratio, signal noise ratio, linear range, thickness tolerance , residual image, etc., shall be in accordance with those specified in the corresponding national or professional standards." "4.2.2.7 The quality certificate of the detector system shall include at least the technical parameters such as detector type, conversion screen parameters (if any), pixel size, imaging area, applicable range of ray energy, quantum conversion efficiency, fill factor, acquired frame rate, etc." ○7 In 4.2.4.6, the expression "according to assessment result" is changed to "automatically". ○8 4.2.6 is replaced by the following new provision: 4.2.6 Image quality indicator 4.2.6.1 For the purpose of this part, the image quality indicator includes wire-type image quality indicator and duplex wire-type image quality indicators. 4.2.6.2 The model and specification of the wire-type image quality indicator shall meet the requirements of GB/T 23901.1, while those of the duplex wire-type image quality indicators shall meet the requirements of GB/T 23901.5. ○9 New provisions 4.2.7 and 4.2.8 are added following 4.2.6: “4.2.7 Service performance of the testing system Appropriate testing equipment and apparatus shall be selected according to the performance indexes of each part of the testing system, together with the requirements of the to-be-tested workpiece and this part. The testing certificate certifying the conformity to the performance indexes of the above-mentioned equipment and apparatus and system software functions shall also be provided. The service performance of the testing system shall meet the image quality requirements of this part.” “4.2.8 Calibration or operation verification 4.2.8.1 The bad pixels, linear range, signal noise ratio, thickness tolerance, residual image and other performance indexes of the detector system shall be calibrated at least once a year and recorded. 4.2.8.2 The in-service exposure curve shall be verified at least once a year. The exposure curve shall be replotted in the case any important component of the X-ray machine is replaced or repaired. 4.2.8.3 Bad pixels of the detector are checked at least once every 3 months, and recorded and corrected accordingly. 4.2.8.4 Under one of the following circumstances, the system resolution ratio shall be verified in accordance with the method given in Annex A and recorded. a) alternation in the testing system; b) under normal service conditions, verification shall be carried out at least once every 3 months; c) reuse of the system after shutdown for 1 month. ○10 New provision 5.4.1.3 is added following 5.4.1.2: “If radiography fails to carried out for several times at the angular interval as specified in 5.4.1.1 or 5.4.1.2 due to structural reasons, upon agreement between the contract parties, angular interval specified in 5.4.1.1 or 5.4.1.2 may not be restricted compulsively, but effective measures shall be taken to extend the detectable range of defects as much as possible, and meanwhile signal noise ratio, sensitivity and resolution ratio within the image evaluation scope shall be guaranteed to meet the requirements, and relevant circumstances shall be explained in the testing report.” ○11 5.4.2 is replaced by the following new provision: 5.4.2 "The number of radiography for circumferential welded joints of small-diameter tubes not subjected to 100% testing shall be agreed by contract parties, and relevant records shall be kept.” ○12 "The model and specification of wire-type image quality indicator shall meet the requirements of GB/T 23901.1" in 6.1.1.3 is deleted. ○13 "The model and specification of duplex wire-type image quality indicator shall meet the requirements of GB/T 23901.5" in 6.1.1.4 is deleted. ○14 In 6.1.2.1.2, the expression: "During double-wall single-image radiography" is changed to "During double-wall single-image or double-wall double-image radiography” ○15 6.1.3.1 is replaced by the following new provision: "The duplex wire-type image quality indicator shall be arranged beside the X-ray machine. When the double-wall single-image radiography mode is adopted, the indicator may be arranged beside the detector." ○16 In 6.1.3.2.1, the expression "in the 1/4 position in the length of the tested" is changed to "adjacent to the weld under test". ○17 "For the double-wall double-image radiography mode of small-diameter tube, the penetrated thickness shall be the tube diameter.” is added at the end of 6.1.4.2. ○18 The following is added at the end of 6.1.4.3: "Note: in case of testing crack-sensitive materials or high-strength materials with the lower limit of standard tensile strength Rm ≥ 540MPa, compensation shall not be adopted." ○19 In 6.2.5.2, the expression "radiography specification"” is changed to "radiography parameter". ○20 The following is added at the end of A.5.1 a): "In the case of limited conditions, F may be appropriately reduced, but it shall be ensured that the geometric unsharpness of the testing system is not more than 5% of the pixel size of the detector." ○21 New provision A.6 is added following A.5.2: "The system resolution ratio shall meet the requirements of Tables 4 or 5. Where it is used for testing of double-wall double-image radiography mode for small-diameter tubes, the penetrated thickness in the Table shall be twice the wall thickness of the tube." ○22 In the fifth line of D.1, the expression "P - the pixel size of detector, μm;" is changed to "P - resolution, μm; Note: for the measurement of the normalized signal noise ratio of the system, P represents the system resolution; while for the measurement of the normalized signal noise ratio of the image, it represents the image resolution." ○23 D.2 is replaced by the following new provision: "The measurement of signal noise ratio: take a rectangular area of not less than 20 pixel ×50 pixel in the homogeneous area (for signal noise ratio of an image, it refers to the heat-affected zone or the base material and non-defective zone around the weld), calculate the average and standard deviation of this area, then obtain the measured signal noise ratio SNRm according to the definition of the signal noise ratio."

Foreword I 1 Scope 2 Normative References 3 Terms and Definitions 4 General Requirements 5 Testing Method 6 Image Quality and Assessment 7 Testing Result Assessment and Quality Grading (Acceptance) 8 Image Preservation and Storage 9 Testing Record and Report Appendix A (Normative) Checking Method of System Resolution Ratio Appendix B (Informative) Typical Radiography Mode Appendix C (Normative) Identification of Duplex Wire Type Image Quality Indicators Appendix D (Normative) Test Method for Normalized Signal to Noise Ratio Appendix E (Informative) Testing Report Format

行業標準修改通知單 NB/T 47013.11-2015 《承壓設備無損檢測 第11部分：X射線數字成像檢測》 第1號修改單 本修改單經國家能源局于2018年5月14日以第7號公告批準，自2018年7月1日起實施。 ① 第2章“GB/T 23903 射線圖像分辨力測試計”后補充新條文： “GB/T 26592 無損檢測儀器 工業X射線探傷機性能測試方法 GB/T 26594 無損檢測儀器 工業用X射線管性能測試方法” 第2章“NB/T47013.2 承壓設備無損檢測 第2部分：射線檢測”后補充新條文： “JB/T 11608 無損檢測儀器 工業用X射線探傷裝置” ② 4.1.1條中更改用語： “并取得《放射工作人員證》”更改為“并按照有關法規的要求取得相應證書”。 ③ 4.2條中更改用語： “檢測系統”更改為“檢測系統與器材”。 ④ 4.2.1.2條后補充新條文，4.2.1.3 ： “采用的X射線機，其性能指標應滿足JB/T11608的規定，使用性能測試條件及測試方法參考GB/T26594 和GB/T26592的規定。” ⑤ 4.2.2.4 條改用新條文： 4.2.2.4“壞像素要求：面陣列探測器3×3像素區域中，相鄰壞像素不得超過3個；成行（成列）壞像素不得超過3個，且不得位于距離中心位置200像素以內；成像區域內壞像素不超過總像素的1%。線陣列探測器中，相鄰的壞像素不允許超過2個。探測器系統供應商應提供出廠壞像素表和壞像素校正方法。” ⑥ 在4.2.2.5后補充新條文，4.2.2.6和4.2.2.7： “4.2.2.6探測器系統性能指標如：壞像素、對比靈敏度、分辨率、信噪比、線性范圍、厚度寬容度、殘影等，其測試條件及測試方法按相應國家或行業標準的規定執行。” “4.2.2.7探測器系統質量合格證中至少應給出探測器類型、轉換屏參數（如有）、像素尺寸、成像面積、射線能量適用范圍、量子轉換效率、填充因子、采集幀頻等技術參數。” ⑦ 4.2.4.6條中更改用語： “根據評定結果”更改為“自動”。 ⑧ 4.2.6條改用新條文： 4.2.6 “像質計 4.2.6.1本部分采用的像質計包括線型像質計和雙線型像質計。 4.2.6.2線型像質計的型號和規格應符合GB/T 23901.1的規定，雙線型像質計的型號和規格應符合GB/T 23901.5的規定。” ⑨ 4.2.6條后補充新條文，4.2.7、4.2.8： “4.2.7檢測系統使用性能 應結合被檢工件和本部分要求，根據檢測系統各部分性能指標選擇合適的檢測設備和器材，并提供滿足上述設備和器材性能指標及系統軟件功能的測試證明文件。檢測系統的使用性能應滿足本部分規定的圖像質量要求。” “4.2.8校準或運行核查 4.2.8.1 每年至少對探測器系統性能中的壞像素、線性范圍、信噪比、厚度寬容度、殘影等進行1次校準并記錄。 4.2.8.2 每年至少應對使用中的曝光曲線進行1次核查。當射線機重要部件更換或經過修理后，應重新制作曝光曲線。 4.2.8.3 每3個月至少對探測器壞像素進行1次核查，并記錄和校正。 4.2.8.4 存在如下情況應進行系統分辨率核查并記錄，核查方法按附錄A執行。 a）檢測系統有改變時； b）正常使用條件下，每3個月應至少核查一次； c）在系統停止使用一個月后重新使用時。” ⑩ 5.4.1.2條后補充新條文，5.4.1.3： “由于結構原因不能按照5.4.1.1或5.4.1.2規定的間隔角度進行多次透照時，經合同雙方商定，可不再強制限制5.4.1.1或5.4.1.2規定的間隔角度，但應采取有效措施盡量擴大缺陷可檢出范圍，并保證圖像評定范圍內信噪比、靈敏度和分辨率滿足要求，并在檢測報告中對有關情況進行說明。” ○11 5.4.2條改用新條文： 5.4.2“不要求100%檢測的小徑管環向焊接接頭的透照次數由合同雙方商定，并保存相關記錄。 ○12 將6.1.1.3條中的“線型像質計的型號和規格應符合GB/T 23901.1的規定”刪除。 ○13 將6.1.1.4條中的“雙線型像質計的型號和規格應符合GB/T 23901.5的規定”刪除。 ○14 6.1.2.1.2條中更改用語： “雙壁單影透照時”更改為“雙壁單影或雙壁雙影透照時” ○15 6.1.3.1條改用新條文： 6.1.3.1“雙線型像質計應放在射線機側。當采用雙壁單影透照方式時，可放在探測器側。” ○16 6.1.3.2.1條中更改用語： “被檢測區長度的1/4左右位置”更改為“靠近被檢焊縫”。 ○17 在6.1.4.2條句尾補充“對于小徑管雙壁雙影透照方式，透照厚度應取管子直徑。” ○18 在6.1.4.3條句尾補充: “注：對于使用裂紋敏感性材料或標準抗拉強度下限值Rｍ≥540MPa高強度材料進行檢測時，不得采取補償。” ○19 6.2.5.2條第一行中更改用語： “透照規格”更改為“透照參數”。 ○20 在A.5.1 a）條句尾補充： “在條件受限情況下，可適當減小F，但應保證檢測系統的幾何不清晰度不大于探測器像素尺寸的5%。” ○21 在A.5.2后補充新條文，A.6： “系統分辨率應滿足表4或表5的要求，用于小徑管雙壁雙影透照方式檢測時，表中透照厚度應取2倍管子壁厚。” ○22 D.1中第5行中更改用語： “P—探測器像素大小（μm）”更改為：“P—分辨力（μm）； 注：測量系統歸一化信噪比時，P為系統分辨力；測量圖像歸一化信噪比時，P為圖像分辨力”。 ○23 D.2條改用新條文： D.2“信噪比測量是指在均勻區域（圖像信噪比指熱影響區或焊縫附近的母材、無缺陷處），取面積不小于20像素×55像素的矩形區，計算此區域的均值和標準差，按照信噪比定義得到測量信噪比SNRm。”